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2023 CPES Conference - Technical Session

Technical Session T3: EMI Analysis and Mitigation

T3.1: Noise Propagation Study on Gate Drivers Caused by Near Field Coupling inside Medium Voltage High Power SiC-based Converters
He Song, Dushan Boroyevich
T3.2: Reduction of CM Noise by Minimizing Near-Field Effects in a DC/DC Converter
Tyler McGrew, Shuo Wang, Qiang Li
T3.3: EMI Mitigation for SiC MOSFET Power Modules Using Integrated Common-Mode Screen
Taha Moaz, Narayanan Rajagopal, Christina DiMarino, and Michael Fish

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