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Considerations for Mitigating False Triggering of a Truly Differential Input Gate Driver for 1.2kV SiC MOSFETs

Year: 2023 | Author: Jesi Miranda-Santos | Paper: H1.7
System diagram for debugging
Fig.1. System diagram for debugging the gate driver.
  An experimental noise propagation study for a truly differential input (TDI) gate driver to eliminate noise-induced false triggering events via double pulse tests (DPT) is presented. A system-level analysis approach was taken to identify and troubleshoot the false-triggering problem. Fig.1 shows a simplified system diagram for troubleshooting the Infineon 1EDN7550U gate driver and noise paths that were hypothesized to trigger the driver. Following the system analysis, a pulse-width modulation (PWM) signal path and printed circuit board (PCB) layout were investigated for their sensitivity to noise coupling because the inverted signal input of the gate driver is connected to the switching node of the half-bridge, which experiences a voltage swing. It was hypothesized that common-mode (CM) noise circulates back to the input of both the gate driver via the power supply and the Tektronix AFG3152C function generator during transient turn-on, causing false triggering.

  To decouple the PWM signal from the common ground, fiber optic cables were installed, which enabled DPTs to be performed at higher and higher voltages until false triggering was observed at 500 V and 1 A. Modifications to the PCB layout were considered for overcoming the voltage and current limitations. For instance, the differential-pair signal lines were symmetrically routed to help increase CM noise immunity to the input of the gate driver. Furthermore, power planes were converted to traces to eliminate any unintended CM noise paths within the PCB layers. Lastly, a shield plane was added to the last layer of the PCB to provide a path of least resistance and inductance for the transient generated noise to flow away from the sensitive differential-pair signal lines.

  These investigations and solutions enabled DPTs at a drain-to-source voltage of 600 V and a load current of 25 A with no false-turn on events, where a maximum dV/dt of 80 V/ns was achieved. Before the proposed solutions, false triggering was observed at less than 100 V, 5 A at a maximum dV/dt of 16 V/ns.
Device switching waveforms
Fig. 2. Bottom device DPT at 600 V (Vds) and 25 A (ILoad) showing the Vgs (yellow), Vds (blue), and ILoad (magenta). External gate resistance was 0 ?.

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